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### Online Test Series Schedule for GATE 2017

Branch: Electrical Engineering

Branch: Electrical Engineering

Test Name | Description |
---|---|

Chapter-wise Tests Total: 20 tests |
Commence from 9 2016 onwards^{th} June |

Subject-wise Tests Total: 40 tests |
Commence from 8 2016 onwards^{th} August |

Full Length Mock GATE Total: 12 tests |
Commence from 20 2016 onwards^{th} November |

### Chapter-wise Tests

#### (Each test carries 25 marks and 45 minutes duration.Test consists of 5 one mark questions and 10 two mark questions)

**Note: First letter in subject code refers to GATE exam**

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GEC-1 |
KCL, KVL, Node and Mesh analysis, Ideal current and voltage sources, Thevenin’s theorem, Norton’s theorem, Superposition theorem, Maximum power transfer theorem. | Electrical CircuitsTest code: GEC |

GEC-2 |
Network graph, Transient response of dc and ac networks, Sinusoidal steady‐state analysis, Resonance, Passive filters,Two‐port networks, Three phase circuits, Power and power factor in ac circuits. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GEF-1 |
Coulomb’s Law, Electric Field Intensity, Electric Flux Density, Gauss’s Law, Divergence, Electric field and potential due to point, line, plane and spherical charge distributions, Effect of dielectric medium, Capacitance of simple configurations | Electromagnetic FieldsTest code: GEF |

GEF-2 |
Biot‐Savart’s law, Ampere’s law, Curl, Faraday’s law, Lorentz force, Inductance, Magnetomotive force, Reluctance, Magnetic circuits, Self and Mutual inductance of simple configurations. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GSS-1 |
Representation of continuous and discrete‐time signals, Shifting and scaling operations, Linear Time Invariant and Causal systems | Signals & SystemsTest code: GSS |

GSS-2 |
Fourier series representation of continuous periodic signals, Sampling theorem, Applications of Fourier Transform, Laplace Transform and z-Transform. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GMC-1 |
Single phase transformer: equivalent circuit, phasor diagram, open circuit and short circuit tests, regulation and efficiency; Three phase transformers: connections, parallel operation; Auto‐transformer, Three phase induction motors: principle of operation, types, performance, torque-speed characteristics, no-load and blocked rotor tests, equivalent circuit, starting and speed control; Operating principle of single phase induction motors. | Electrical MachinesTest code: GMC |

GMC-2 |
Electromechanical energy conversion principles, DC machines: separately excited, series and shunt, motoring and generating mode of operation and their characteristics, starting and speed control of dc motors. Synchronous machines: cylindrical and salient pole machines, performance, regulation and parallel operation of generators, starting of synchronous motor, characteristics; Types of losses and efficiency calculations of electric machines. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GPS-1 |
Models and performance of transmission lines and cables, Series and shunt compensation, Voltage Control, Power factor correction, Electric field distribution and insulators, Distribution systems, Principles of over‐current, differential and distance protection; Circuit breakers | Power SystemsTest code: GPS |

GPS-2 |
Power generation concepts, ac and dc transmission concepts, Per‐unit quantities, Bus admittance matrix, Gauss-Seidel and Newton-Raphson load flow methods, Frequency control, Symmetrical components, Symmetrical and unsymmetrical fault analysis, System stability concepts, Equal area criterion |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GCS-1 |
Feedback principle, transfer function, Block diagrams and Signal flow graphs, Transient and Steady‐state analysis of linear time invariant systems, Routh-Hurwitz, Root loci and Stability analysis | Control SystemsTest code: GCS |

GCS-2 |
Mathematical modeling and representation of systems, and Nyquist criteria, Bode plots, Lag, Lead and Lead‐Lag compensators; P, PI and PID controllers; State space model, State transition matrix. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GME-1 |
Bridges and Potentiometers, Measurement of voltage, current, power, energy and power factor; Instrument transformers, Error analysis. | MeasurementsTest code: GME |

GME-2 |
Digital voltmeters and multimeters, Phase, Time and Frequency measurement; Oscilloscopes |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GAE-1 |
Characteristics of diodes, BJT, MOSFET; Simple diode circuits: clipping, clamping, rectifiers; Amplifiers: Biasing, Equivalent circuit and Frequency response, | Analog ElectronicsTest code: GAE |

GAE-2 |
Oscillators and Feedback amplifiers; Operational amplifiers: Characteristics and applications; Simple active filters, VCOs and Timers |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GDE-1 |
Combinational and Sequential logic circuits, Multiplexer, Demultiplexer, Schmitt trigger | Digital ElectronicsTest code: GDE |

GDE-2 |
Sample and hold circuits, A/D and D/A converters, 8085 Microprocessor: Architecture, Programming and Interfacing. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GPE-1 |
Characteristics of semiconductor power devices: Diode, Thyristor, Triac, GTO, MOSFET, IGBT; Single and three phase configuration of uncontrolled rectifiers, Line commutated thyristor based converters, Issues of line current harmonics, Power factor, Distortion factor of ac to dc converters. | Power ElectronicsTest code: GPE |

GPE-2 |
DC to DC conversion: Buck, Boost and Buck-Boost converters; Bidirectional ac to dc voltage source converters, Single phase and three phase inverters, Sinusoidal pulse width modulation. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GEM-1 |
Linear Algebra: Matrix Algebra, Systems of linear equations,Eigen values, Eigenvectors.Calculus: Mean value theorems, Theorems of integral calculus, Evaluation of definite and improper integrals, Partial Derivatives, Maxima and minima, Multiple integrals, Fourier series, Vector identities, Directional derivatives, Line integral, Surface integral, Volume integral, Stokes’s theorem, Gauss’s theorem, Green’s theorem.Differential equations: First order equations (linear and nonlinear), Higher order linear differential equations with constant coefficients, Method of variation of parameters, Cauchy’s equation, Euler’s equation, Initial and boundary value problems, Partial Differential Equations, Method of separation of variables. |
Engineering MathematicsTest code: GEM |

GEM-2 |
Complex Analysis: Analytic functions, Cauchy’s integral theorem, Cauchy’s integral formula, Taylor series, Laurent series, Residue theorem, Solution integrals.Probability and Statistics: Sampling theorems, Conditional probability, Mean, Median, Mode, Standard Deviation, Random variables, Discrete and Continuous distributions, Poisson distribution, Normal distribution, Binomial distribution, Correlation analysis, Regression analysis.Numerical Methods: Solutions of nonlinear algebraic equations, Single and Multi‐step methods for differential equations.Transform Theory: Fourier Transform, Laplace Transform, Z‐Transform. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GVA |
English grammar, sentence completion, verbal analogies, word groups, instructions, critical reasoning and verbal deduction | General AptitudeTest code: GGA |

GNA |
Numerical computation, numerical estimation, numerical reasoning and data interpretation. |

### Chapter-wise Tests

#### (Each test carries 25 marks and 45 minutes duration.)

#### (Test consists of 5 one mark questions and 10 two mark questions)

Test No | Test Codes | Date of Available |
---|---|---|

EE-01 | GEC – 1 | 09^{th}June 2016 |

EE-02 | GEC – 2 | 12^{th}June 2016 |

EE-03 | GEF – 1 | 15^{th}June 2016 |

EE-04 | GEF – 2 | 18^{th}June 2016 |

EE-05 | GSS – 1 | 21^{st}June 2016 |

EE-06 | GSS – 2 | 24^{th}June 2016 |

EE -07 | GMC – 1 | 27^{th}June 2016 |

EE-08 | GMC – 2 | 30^{th}June 2016 |

EE-09 | GPS – 1 | 3^{rd}July 2016 |

EE-10 | GPS – 2 | 6^{th}July 2016 |

EE-11 | GCS – 1 | 9^{th}July 2016 |

EE-12 | GCS – 2 | 12^{th}July 2016 |

EE-13 | GME – 1 | 15^{th}July 2016 |

EE-14 | GME – 2 | 18^{th}June 2016 |

EE-15 | GAE-1, GDE-1 | 21^{st}July 2016 |

EE-16 | GAE-2, GDE-2 | 24^{th}June 2016 |

EE-17 | GPE – 1 | 27^{th}July 2016 |

EE-18 | GPE – 2 | 30^{th}July 2016 |

EE-19 | GEM – 1 & GVA | 02^{nd}Aug 2016 |

EE-20 | GEM – 2 & GNA | 05^{th}Aug 2016 |

### Subject-wise Grand Tests- 1^{st} Series

#### (Each test carries 50 marks and 90 minutes duration.Test consists of 10 one mark questions and 20 two mark questions)

Commences from 8^{th} August, 2016 onwards, the detailed test schedule is as follows:

Test No | Test Codes | Date of Available |
---|---|---|

EE -21 | GEC | 08^{th}Aug 2016 |

EE -22 | GEF | 11^{th}Aug 2016 |

EE -23 | GSS | 14^{th}Aug 2016 |

EE -24 | GMC | 17^{th}Aug 2016 |

EE -25 | GPS | 20^{th}Aug 2016 |

EE -26 | GCS | 23^{rd}Aug 2016 |

EE -27 | GME | 26^{th}Aug 2016 |

EE -28 | GAE | 29^{th}Aug 2016 |

EE -29 | GDE | 1^{st}Sep 2016 |

EE -30 | GPE | 4^{th}Sep 2016 |

EE -31 | GEM | 7^{th}Sep 2016 |

EE -32 | GGA | 10^{th}Sep 2016 |

### Subject-wise Grand Tests- 2^{nd} Series

#### (Each test carries 50 marks and 90 minutes duration.Test consists of 10 one mark questions and 20 two mark questions)

Commences from 13^{th} September, 2016 onwards, the detailed test schedule is as follows:

Test No | Test Codes | Date of Available |
---|---|---|

EE -33 | GEC | 13^{th}Sep 2016 |

EE -34 | GEF | 15^{th}Sep 2016 |

EE -35 | GSS | 17^{th}Sep 2016 |

EE -36 | GMC | 19^{th}Sep 2016 |

EE -37 | GPS | 21^{st}Sep 2016 |

EE -38 | GCS | 23^{rd}Sep 2016 |

EE -39 | GME | 25^{th}Sep 2016 |

EE -40 | GAE | 27^{th}Sep 2016 |

EE -41 | GDE | 29^{th}Sep 2016 |

EE -42 | GPE | 01^{st}Oct 2016 |

EE -43 | GEM | 03^{rd}Oct 2016 |

EE -44 | GGA | 05^{th}oct 2016 |

### Subject-wise Grand Tests – 3^{rd} Series

#### (Each test carries 50 marks and 90 minutes duration.Test consists of 10 one mark questions and 20 two mark questions)

Commences from 8^{th} October, 2016 onwards, the detailed test schedule is as follows:

Test No | Test Codes | Date (Available from) |
---|---|---|

EE-45 | GEC, GEF | 08^{th}Oct 2016 |

EE-46 | GCS, GPS | 11^{th}Oct 2016 |

EE-47 | GSS, GPE | 14^{th}Oct 2016 |

EE-48 | GME, GAE | 17^{th}Oct 2016 |

EE-49 | GDE, GMC | 20^{th}Oct 2016 |

EE-50 | GEM, GGA | 23^{rd}Oct 2016 |

Test No | Test Codes | Date (Available from) |
---|---|---|

EE-51 | GEC, GPE | 26^{th}Oct 2016 |

EE-52 | GDE, GPS | 28^{th}Oct 2016 |

EE-53 | GSS, GCS | 30^{th}Oct 2016 |

EE-54 | GEF, GMC | 01^{st}Nov 2016 |

EE-55 | GME, GAE | 03^{rd}Nov 2016 |

EE-56 | GEM, GGA | 05^{th}Nov 2016 |

Test No | Test Codes | Date (Available from) |
---|---|---|

EE-57 | GEC, GEF, GCS, GSS | 07^{th}Nov 2016 |

EE-58 | GPS, GME, GDE | 09^{th}Nov 2016 |

EE-59 | GPE, GAE, GMC | 11^{th}Nov 2016 |

EE-60 | GEM, GGA | 13^{th}Nov 2016 |

### Electrical Engineering

### Full Length Mock GATE (Tentative Schedule)

#### (Each test carries 100 marks and 3 hours duration As per GATE Pattern)

Test No | Test Codes | Date (Available from) |
---|---|---|

EE-61 | Mock – 1 | 20^{th}Nov 2016 |

EE-62 | Mock – 2 | 26^{th}Nov 2016 |

EE-63 | Mock – 3 | 02^{nd}Dec 2016 |

EE-64 | Mock – 4 | 08^{th}Dec 2016 |

EE-65 | Mock – 5 | 14^{th}Dec 2016 |

EE-66 | Mock – 6 | 20^{th}Dec 2016 |

EE-67 | Mock – 7 | 25^{th}Dec 2016 |

EE-68 | Mock – 8 | 31^{st}Dec 2016 |

EE-69 | Mock – 9 | 05^{th}Jan 2017 |

EE-70 | Mock – 10 | 10^{th}Jan 2017 |

EE-71 | Mock –11 | 15^{th}Jan 2017 |

EE-72 | Mock – 12 | 20^{th}Jan 2017 |