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### Online Test Series Schedule for GATE 2017

Branch: Electronics & Communication Engineering

Branch: Electronics & Communication Engineering

Test Name | Description |
---|---|

Chapter-wise Tests Total: 20 tests |
Commence from 9 2016 onwards^{th} June |

Subject-wise Grand Tests Total: 40 tests |
Commence from 8 2016 onwards^{th} August |

Full Length Mock GATE Total: 12 tests |
Commence from 20 2016 onwards^{th} November |

### Chapter-wise Tests

#### (Each test carries 25 marks and 45 minutes duration.Test consists of 5 one mark questions and 10 two mark questions)

**Note: First letter in subject code refers to GATE exam**

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GNW-1 |
Network solution methods: nodal and mesh analysis; Network theorems: superposition, Thevenin and Norton’s, maximum power transfer; Wye‐Delta transformation | NetworksTest code: GNW |

GNW-2 |
Steady state sinusoidal analysis using phasors; Time domain analysis of simple linear circuits; Solution of network equations using Laplace transform; Frequency domain analysis of RLC circuits; Linear 2‐port network parameters: driving point and transfer functions; State equations for networks. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GSS-1 |
Introduction to signals, LTI systems: definition and properties,causality, stability, impulse response, convolution. Fourier series and Fourier transform representations. sampling theorem and applications. Frequency response, group delay and phase delay. | Signals & SystemsTest code: GSS |

GSS -2 |
Laplace transform, discrete-time Fourier transform (DTFT),DFT, FFT, Z-transform, interpolation of discrete-time signals, poles and zeros, parallel and cascade structure, digital filter design techniques. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GCS-1 |
Basic control system components; Feedback principle; Transfer function; Block diagram representation; Signal flow graph; Transient and steady-state analysis of LTI systems; Routh – Hurwitz stability criteria. | Control SystemsTest code: GCS |

GCS -2 |
Frequency response; Nyquist stability criteria; Bode and root-locus plots; Lag, lead and lag-lead compensation; State variable model and solution of state equation of LTI systems. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GDC-1 |
Number systems; Combinatorial circuits: Boolean algebra, minimization of functions using Boolean identities and Karnaugh map, logic gates and their static CMOS implementations, arithmetic circuits, code converters, multiplexers, decoders and PLAs; Sequential circuits: latches and flip‐flops, counters, shift‐registers and finite state machines. | Digital CircuitsTest code: GDC |

GDC -2 |
Data converters: sample and hold circuits, ADCs and DACs; Semiconductor memories: ROM, SRAM, DRAM, 8-bit microprocessor (8085): architecture, programming, memory and I/O interfacing. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GEDC-1 |
Energy bands in intrinsic and extrinsic silicon; Carrier transport: diffusion current, drift current, mobility and resistivity; Generation and recombination of carriers; Poisson and continuity equations: P-N junction, Zener diode, BJT. | EDC & VLSITest code: GEDC |

GEDC-2 |
MOS capacitor, MOSFET, LED, photo diode and solar cell; Integrated circuit fabrication process: oxidation, diffusion, ion implantation, photolithography and twin-tub CMOS process. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GAC-1 |
Small signal equivalent circuits of diodes, BJTs and MOSFETs; Simple diode circuits: clipping, clamping and rectifiers; Single-stage BJT and MOSFET amplifiers: biasing, bias stability, mid-frequency small signal analysis and frequency response; BJT and MOSFET amplifiers: multi-stage. | Analog CircuitsTest code: GAC |

GAC-2 |
Differential, feedback, power and operational; Simple op-amp circuits; Active filters; Sinusoidal oscillators: criterion for oscillation, single-transistor and op- amp configurations; Function generators, wave-shaping circuits and 555 timers; Voltage reference circuits; Power supplies: ripple removal and regulation. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GCMS-1 |
Analog communications: amplitude modulation and demodulation, angle modulation and demodulation, spectra of AM and FM, superheterodyne receivers, circuits for analog communications, Random processes: autocorrelation and power spectral density, properties of white noise, filtering of random signals through LTI systems; ; Information theory: entropy, mutual information and channel capacity theorem. | CommunicationsTest code: GCMS |

GCMS-2 |
Digital communications: PCM, DPCM, digital modulation schemes, amplitude, phase and frequency shift keying (ASK, PSK, FSK), QAM, MAP and ML decoding, matched filter receiver, calculation of bandwidth, SNR and BER for digital modulation; Fundamentals of error correction, Hamming codes;Timing and frequency synchronization, inter-symbol interference and its mitigation; Basics of TDMA, FDMA and CDMA. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GEMT-1 |
Electrostatics; Maxwell’s equations: differential and integral forms and their interpretation, boundary conditions, wave equation, Poynting vector; Plane waves and properties: reflection and refraction, polarization, phase and group velocity, propagation through various media, skin depth. | ElectromagneticsTest code: GEMT |

GEMT-2 |
Transmission lines: equations, characteristic impedance, impedance matching, impedance transformation, S-parameters, Smith chart; Waveguides: modes, boundary conditions, cut-off frequencies, dispersion relations; Antennas: antenna types, radiation pattern, gain and directivity, return loss, antenna arrays; Basics of radar; Light propagation in optical fibers. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GEM-1 |
Linear Algebra: Vector space, basis, linear dependence and independence, matrix algebra, eigen values and eigen vectors, rank, solution of linear equations – existence and uniqueness.Calculus: Mean value theorems, theorems of integral calculus, evaluation of definite and improper integrals, partial derivatives, maxima and minima, multiple integrals, line, surface and volume integrals, Taylor series.Vector Analysis: Vectors in plane and space, vector operations, gradient, divergence and curl, Gauss’s, Green’s and Stoke’s theorems.Differential Equations: First order equations (linear and nonlinear), higher order linear differential equations, Cauchy’s and Euler’s equations, methods of solution using variation of parameters, complementary function and particular integral, partial differential equations, variable separable method, initial and boundary value problems. |
Engineering MathematicsTest code: GEM |

GEM-2 |
Complex Analysis: Analytic functions, Cauchy’s integral theorem, Cauchy’s integral formula; Taylor’s and Laurent’sseries, residue theorem. Numerical Methods: Solution of nonlinear equations, single and multi-step methods for differential equations, convergence criteria.Probability and Statistics: Mean, median, mode and standard deviation; combinatorial probability, probability distribution functions – binomial, Poisson, exponential and normal; Joint and conditional probability; Correlation and regression analysis. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GVA |
English grammar, sentence completion, verbal analogies, word groups, instructions, critical reasoning and verbal deduction. | General AptitudeTest code: GGA |

GNA |
Numerical computation, numerical estimation, numerical reasoning and data interpretation.. |

### Chapter-wise Tests

#### (Each test carries 25 marks and 45 minutes duration.)

#### (Test consists of 5 one mark questions and 10 two mark questions)

Test No | Test Codes | Date of Available |
---|---|---|

EC -01 | GNW – 1 | 09^{th}June 2016 |

EC -02 | GNW – 2 | 12^{th}June 2016 |

EC -03 | GSS – 1 | 15^{th}June 2016 |

EC -04 | GSS – 2 | 18^{th}June 2016 |

EC -05 | GAC – 1 | 21^{st}June 2016 |

EC -06 | GAC – 2 | 24^{th}June 2016 |

EC -07 | GDC – 1 | 27^{th}June 2016 |

EC -08 | GDC – 2 | 30^{th}June 2016 |

EC -09 | GEDC – 1 | 3^{rd}July 2016 |

EC -10 | GEDC – 2 | 6^{th}July 2016 |

EC -11 | GCS – 1 | 9^{th}July 2016 |

EC -12 | GCS – 2 | 12^{th}July 2016 |

EC -13 | GCMS – 1 | 15^{th}July 2016 |

EC -14 | GCMS – 2 | 18^{th}July 2016 |

EC -15 | GEMT – 1 | 21^{th}July 2016 |

EC -16 | GEMT – 2 | 24^{th}July 2016 |

EC -17 | GEM – 1 | 27^{th}July 2016 |

EC -18 | GEM – 2 | 30^{th}July 2016 |

EC -19 | GVA | 02^{nd}Aug 2016 |

EC -20 | GNA | 05^{th}Aug 2016 |

### Subject-wise Grand Tests- 1^{st} Series

#### (Each test carries 50 marks and 90 minutes duration.Test consists of 10 one mark questions and 20 two mark questions)

Commences from 8^{th} August, 2016 onwards, the detailed test schedule is as follows:

Test No | Test Codes | Date of Available |
---|---|---|

EC -21 | GNW | 08^{th}Aug 2016 |

EC -22 | GSS | 11^{th}Aug 2016 |

EC -23 | GAC | 14^{th}Aug 2016 |

EC -24 | GDC | 17^{th}Aug 2016 |

EC -25 | GEDC | 20^{th}Aug 2016 |

EC -26 | GCS | 23^{rd}Aug 2016 |

EC -27 | GCMS | 26^{th}Aug 2016 |

EC -28 | GEMT | 29^{th}Aug 2016 |

EC -29 | GEM | 1^{st}Sep 2016 |

EC -30 | GVA & GNA | 4^{th}Sep 2016 |

### Subject-wise Grand Tests- 2^{nd} Series

#### (Each test carries 50 marks and 90 minutes duration.Test consists of 10 one mark questions and 20 two mark questions)

Commences from 7^{th} September, 2016 onwards, the detailed test schedule is as follows:

Test No | Test Codes | Date of Available |
---|---|---|

EC -31 | GNW | 07^{th}Sep 2016 |

EC -32 | GSS | 10^{th}Sep 2016 |

EC -33 | GEMT | 13^{th}Sep 2016 |

EC -34 | GDC | 15^{th}Sep 2016 |

EC -35 | GEDC | 17^{th}Sep 2016 |

EC -36 | GAC | 19^{th}Sep 2016 |

EC -37 | GCMS | 21^{st}Sep 2016 |

EC -38 | GCS | 23^{rd}Sep 2016 |

EC -39 | GEM | 25^{th}Sep 2016 |

EC -40 | GVA & GNA | 27^{th}Sep 2016 |

### Subject-wise Grand Tests with combinations

#### (Each test carries 50 marks and 90 minutes duration.Test consists of 10 one mark questions and 20 two mark questions)

Commences from 30^{th} September, 2016 onwards, the detailed test schedule is as follows:

Test No | Test Codes | Date (Available from) |
---|---|---|

EC -41 | GNW, GEMT | 30^{th}Sep 2016 |

EC -42 | GCS, GDC | 03^{rd}Oct 2016 |

EC -43 | GEDC, GAC | 06^{th}Oct 2016 |

EC -44 | GCMS, GSS | 09^{th}Oct 2016 |

EC -45 | GEM | 12^{th}Oct 2016 |

EC -46 | GGA | 15^{th}Oct 2016 |

Test No | Test Codes | Date (Available from) |
---|---|---|

EC -47 | GNW, GSS | 17^{th}Oct 2016 |

EC -48 | GCS, GEMT | 19^{th}Oct 2016 |

EC -49 | GEDC, GAC | 21^{st}Oct 2016 |

EC -50 | GCMS, GDC | 23^{rd}Oct 2016 |

Test No | Test Codes | Date (Available from) |
---|---|---|

EC -51 | GSS, GNW, GCS | 25^{th}Oct 2016 |

EC -52 | GDC, GEDC, GAC | 27^{th}Oct 2016 |

EC -53 | GCMS, GEMT | 29^{th}Oct 2016 |

EC -54 | GEM, GGA | 31^{st}Oct 2016 |

EC -55 | GSS, GCMS | 02^{nd}Nov 2016 |

EC -56 | GNW, GEMT, GCS | 04^{th}Nov 2016 |

EC -57 | GEDC, GDC, GAC | 06^{th}Nov 2016 |

EC -58 | GEM, GGA | 08^{th}Nov 2016 |

EC -59 | GSS, GEMT, GNW, GEM | 10^{th}Nov 2016 |

EC -60 | GCS, GCMS, GGA, GDC | 13^{th}Nov 2016 |

### Electronics & Communication Engineering

### Full Length Mock GATE (Tentative Schedule)

#### (Each test carries 100 marks and 3 hours duration As per GATE Pattern)

Test No | Test Codes | Date (Available from) |
---|---|---|

EC -61 | Mock – 1 | 20^{th}Nov 2016 |

EC -62 | Mock – 2 | 26^{th}Nov 2016 |

EC -63 | Mock – 3 | 2^{nd}Dec 2016 |

EC -64 | Mock – 4 | 8^{th}Dec 2016 |

EC -65 | Mock – 5 | 14^{th}Dec 2016 |

EC -66 | Mock – 6 | 20^{th}Dec 2016 |

EC -67 | Mock – 7 | 25^{th}Dec 2016 |

EC -68 | Mock – 8 | 31^{st}Dec 2016 |

EC -69 | Mock – 9 | 05^{th}Jan 2017 |

EC -70 | Mock – 10 | 10^{th}Jan 2017 |

EC -71 | Mock – 11 | 15^{th}Jan 2017 |

EC -72 | Mock – 12 | 20^{th}Jan 2017 |