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### Online Test Series Schedule for GATE 2017

Branch: Instrumentation Engineering

Branch: Instrumentation Engineering

Test Name | Description |
---|---|

Chapter-wise Tests Total: 20 tests |
Commence from 9 2016 onwards^{th} June |

Subject-wise Grand Tests Total: 40 tests |
Commence from 8 2016 onwards^{th} August |

Full Length Mock GATE Total: 12 tests |
Commence from 21 2016 onwards^{st} November |

### Chapter-wise Tests

#### (Each test carries 25 marks and 45 minutes duration.Test consists of 5 one mark questions and 10 two mark questions)

**Note: First letter in subject code refers to GATE exam**

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GEC- 1 |
Voltage and current sources: independent, dependent, ideal and practical; v-i relationships of resistor, inductor, mutual inductor and capacitor; Kirchoff’s laws, mesh and nodal analysis, superposition, Thevenin, Norton, maximum power transfer and reciprocity theorems. | Electrical CircuitsTest code: GEC |

GEC-2 |
Peak-, average- and rms values of ac quantities; apparent-, active- and reactive powers; phasor analysis, impedance and admittance; series and parallel resonance, locus diagrams, realization of basic filters with R, L and C elements.One-port and two-port networks, driving point impedance and admittance, open-, and short circuit parameters. transient analysis of RLC circuits with dc excitation. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GSS- 1 |
Periodic, aperiodic and impulse signals; Fourier transform. transfer function, frequency response of first and second order linear time invariant systems, impulse response of systems; convolution, correlation. | Signals & SystemsTest code: GSS |

GSS- 2 |
Laplace,and z-transforms; Discrete time system: impulse response, frequency response, pulse transfer function; DFT and FFT; basics of IIR and FIR filters. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GCS- 1 |
Feedback principles, signal flow graphs, transient response, steady-state- errors, | Control SystemsTest code: GCS |

GCS- 2 |
Bode plot, phase and gain margins, Routh and Nyquist criteria, root loci, design of lead, lag and lead-lag compensators, state- space representation of systems; time-delay systems; mechanical, hydraulic and pneumatic system components, synchro pair, servo and stepper motors, servo valves; on-off, P, P-I, P-I- D, cascade, feed forward, and ratio controllers. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GDE- 1 |
Combinational logic circuits, minimization of Boolean functions.. Arithmetic circuits, comparators, Schmitt trigger, multi-vibrators, sequential circuits, flip- flops, basics of number systems, , shift registers, timers and counters; | Digital ElectronicsTest code: GCS |

GDE- 2 |
sample-and- hold circuit, multiplexer, analog-to- digital (successive approximation, integrating, flash and sigma-delta) and digital-to- analog converters (weighted R, R-2R ladder and current steering logic). Characteristics of ADC and DAC (resolution, quantization, significant bits, conversion/settling time); basics of number systems, 8-bit microprocessor and microcontroller: applications, memory and input-output interfacing; basics of data acquisition systems. IC families: TTL and CMOS.. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GSI- 1 |
Resistive-, capacitive-, inductive-, piezoelectric-, Hall effect sensors and associated signal conditioning circuits; transducer for industrial instrumentation: displacement (linear and angular), velocity, acceleration, force, torque, vibration, shock, pressure (including low pressure). | Sensors &Industrialinstrumentation Test code: GSI |

GSI- 2 |
flow (differential pressure, variable area, electromagnetic, ultrasonic, turbine and open channel flow meters) temperatur (thermocouple, bolometer, RTD (3/4 wire), thermistor, pyrometer and semiconductor); liquid level, pH, conductivity and viscosity measurement. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GAE- 1 |
Characteristics and applications of diode, Zener diode, BJT and MOSFET; small signal analysis of transistor circuits, feedback amplifiers . |
Analog ElectronicsTest code: GAE |

GAE- 2 |
Characteristics of operational amplifiers; applications of op amps: difference amplifier, adder, subtractor, integrator, differentiator, instrumentation amplifier, precision rectifier, active filters and other circuits. Oscillators, signal generators,voltage controlled oscillators and phase locked loop. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GCO- 1 |
Amplitude- and frequency modulation and demodulation; Shannon’s sampling theorem, pulse code modulation; frequency and time division multiplexing, amplitude-, phase-, frequency-, pulse shift keying for digital modulation. | Communication&Optical instrumentation Test code: GCO |

GCO- 2 |
optical sources and detectors: LED, laser, photo-diode, light dependent resistor and their characteristics; interferometer: applications in metrology; basics of fiber optic sensing. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GME- 1 |
SI units, systematic and random errors in measurement, expression of uncertainty – accuracy and precision index, propagation of errors. PMMC, MI and dynamometer type instruments; dc potentiometer; bridges for measurement of R, L and C, Q-meter. | MeasurementsTest code: GME |

GME- 2 |
Measurement of voltage, current and power in single and three phase circuits; ac and dc current probes; true rms meters, voltage and current scaling, instrument transformers, timer/counter, time, phase and frequency measurements, digital voltmeter, digital multimeter; oscilloscope, shielding and grounding. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GEM- 1 |
Linear Algebra: Vector space, basis, linear dependence and independence, matrix algebra, eigen values and eigen vectors, rank, solution of linear equations – existence and uniqueness.Calculus: Mean value theorems, theorems of integral calculus, evaluation of definite and improper integrals, partial derivatives, maxima and minima, multiple integrals, line, surface and volume integrals, Taylor series.Vector Analysis: Vectors in plane and space, vector operations, gradient, divergence and curl, Gauss’s, Green’s and Stoke’s theorems.Differential Equations: First order equations (linear and nonlinear), higher order linear differential equations, Cauchy’s and Euler’s equations, methods of solution using variation of parameters, complementary function and particular integral, partial differential equations, variable separable method, initial and boundary value problems. |
Engineering MathematicsTest code: GEM |

GEM- 2 |
Complex Analysis: Analytic functions, Cauchy’s integral theorem, Cauchy’s integral formula; Taylor’s and Laurent’sseries, residue theorem. Numerical Methods: Solution of nonlinear equations, single and multi-step methods for differential equations, convergence criteria.Probability and Statistics: Mean, median, mode and standard deviation; combinatorial probability, probability distribution functions – binomial, Poisson, exponential and normal; Joint and conditional probability; Correlation and regression analysis. |

TEST Code | Topic/Chapter | Subject & Code |
---|---|---|

GVA |
English grammar, sentence completion, verbal analogies, word groups, instructions, critical reasoning and verbal deduction. | General AptitudeTest code: GGA |

GNA |
Numerical computation, numerical estimation, numerical reasoning and data interpretation.. |

### Chapter-wise Tests

#### (Each test carries 25 marks and 45 minutes duration.)

#### (Test consists of 5 one mark questions and 10 two mark questions)

Test No | Test Codes | Date of Available |
---|---|---|

IN -01 | GEC – 1 | 09^{th}June 2016 |

IN -02 | GEC – 2 | 12^{th}June 2016 |

IN -03 | GSS – 1 | 15^{th}June 2016 |

IN -04 | GSS – 2 | 18^{th}June 2016 |

IN -05 | GAE – 1 | 21^{st}June 2016 |

IN -06 | GAE– 2 | 24^{th}June 2016 |

IN -07 | GDE– 1 | 27^{th}June 2016 |

IN -08 | GDE – 2 | 30^{th}June 2016 |

IN -09 | GSI – 1 | 03^{rd}July 2016 |

IN-10 | GSI – 2 | 06^{th}July 2016 |

IN -11 | GCS – 1 | 09^{th}July 2016 |

IN -12 | GCS – 2 | 12^{th}July 2016 |

IN -13 | GCO – 1 | 15^{th}July 2016 |

IN -14 | GCO– 2 | 18^{th}June 2016 |

IN -15 | GME – 1 | 21^{st}July 2016 |

IN -16 | GME – 2 | 24^{th}July 2016 |

IN -17 | GEM – 1 | 27^{th}July 2016 |

IN -18 | GEM – 2 | 30^{th}July 2016 |

IN -19 | GVA | 02^{nd}Aug 2016 |

IN -20 | GNA | 05^{th}Aug 2016 |

### Subject-wise Grand Tests- 1^{st} Series

#### (Each test carries 50 marks and 90 minutes duration.Test consists of 10 one mark questions and 20 two mark questions)

Commences from 8^{th} August, 2016 onwards, the detailed test schedule is as follows:

Test No | Test Codes | Date of Available |
---|---|---|

IN -21 | GEC | 08^{th}Aug 2016 |

IN -22 | GSS | 11^{th}Aug 2016 |

IN -23 | GAE | 14^{th}Aug 2016 |

IN -24 | GDE | 17^{th}Aug 2016 |

IN -25 | GSI | 20^{th}Aug 2016 |

IN -26 | GCS | 23^{rd}Aug 2016 |

IN -27 | GCO | 26^{th}Aug 2016 |

IN -28 | GME | 29^{th}Aug 2016 |

IN -29 | GEM | 01^{st}Sep 2016 |

IN-30 | GVA & GNA | 04^{th}Sep 2016 |

### Subject-wise Grand Tests- 2^{nd} Series

#### (Each test carries 50 marks and 90 minutes duration.Test consists of 10 one mark questions and 20 two mark questions)

Commences from 7^{th} September, 2016 onwards, the detailed test schedule is as follows:

Test No | Test Codes | Date of Available |
---|---|---|

IN -31 | GEC | 07^{th}Sep 2016 |

IN -32 | GSS | 10^{th}Sep 2016 |

IN -33 | GME | 13^{th}Sep 2016 |

IN -34 | GDE | 15^{th}Sep 2016 |

IN -35 | GSI | 17^{th}Sep 2016 |

IN -36 | GAE | 19^{th}Sep 2016 |

IN -37 | GCO | 21^{st}Sep 2016 |

IN -38 | GCS | 23^{rd}Sep 2016 |

IN -39 | GEM | 25^{th}Sep 2016 |

IN-40 | GVA & GNA | 27^{th}Nov 2016 |

### Subject-wise Grand Tests with combinations

#### (Each test carries 50 marks and 90 minutes duration.Test consists of 10 one mark questions and 20 two mark questions)

Commences from 30^{th} September, 2016 onwards, the detailed test schedule is as follows:

Test No | Test Codes | Date of Available |
---|---|---|

IN -41 | GEC, GME | 30^{th}Sep 2016 |

IN -42 | GCS, GDE | 03^{rd}Oct 2016 |

IN -43 | GSI, GAE | 06^{th}Oct 2016 |

IN -44 | GCO, GSS | 09^{th}Oct 2016 |

IN -45 | GEM | 12^{th}Oct 2016 |

IN -46 | GGA | 15^{th}Oct 2016 |

Test No | Test Codes | Date of Available |
---|---|---|

IN -47 | GEC, GSS | 17^{th}Oct 2016 |

IN -48 | GCS, GME | 19^{th}Oct 2016 |

IN -49 | GSI, GAE | 21^{st}Oct 2016 |

IN -50 | GCO, GDE | 23^{rd}Oct 2016 |

Test No | Test Codes | Date of Available |
---|---|---|

IN -51 | GSS GEC, GCS | 25^{th}Oct 2016 |

IN -52 | GDE, GSI, GAE | 27^{th}Oct 2016 |

IN -53 | GCO, GME | 29^{th}Oct 2016 |

IN -54 | GEM, GGA | 31^{st}Nov 2016 |

IN -55 | GSS, GCO | 02^{nd}Nov 2016 |

IN -56 | GEC, GME, GCS | 04^{th}Nov 2016 |

IN -57 | GSI, GDE, GAE | 06^{th}Nov 2016 |

IN -58 | GEM, GGA | 08^{th}Nov 2016 |

IN -59 | GSS, GME, GEC, GEM | 10^{th}Nov 2016 |

IN-60 | GCS, GCO, GGA, GDE | 13^{th}Nov 2016 |

### Instrumentation Engineering

### Full Length Mock GATE (Tentative Schedule)

#### (Each test carries 100 marks and 3 hours duration As per GATE Pattern)

Test No | Test Codes | Date of Available |
---|---|---|

IN-61 | Mock – 1 | 21^{st}Nov 2016 |

IN-62 | Mock – 2 | 27^{th}Nov 2016 |

IN-63 | Mock – 3 | 03^{rd}Dec 2016 |

IN-64 | Mock – 4 | 09^{th}Dec 2016 |

IN-65 | Mock – 5 | 15^{th}Dec 2016 |

IN-66 | Mock – 6 | 21^{st}Dec 2016 |

IN -67 | Mock – 7 | 26^{th}Dec 2016 |

IN-68 | Mock – 8 | 01^{st}Jan 2017 |

IN-69 | Mock – 9 | 06^{th}Jan 2017 |

IN-70 | Mock – 10 | 11^{th}Jan 2017 |

IN-71 | Mock – 11 | 16^{th}Jan 2017 |

IN-72 | Mock – 12 | 21^{st}Jan 2017 |