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Online Tests - Detailed Schedule
For
GATE 2013

Branch: EEE


All Tests will be open till second week of Feb 2013,

Student can attempt each test only once. Prepare for the test before attempting it.

Click Here To BUY This Test Series
Test Name Description
Chapter-wise Tests
Total: about 35 tests
Commence from 15th July 2012 onwards
Subject-wise Grand Tests
Total: about 24 tests
1st Series : Commences from 03rd October 2012 onwards
2nd Series : Commences from 05th January 2013 onwards
Multiple subject Grand Tests
Total : 1 test
Commence from November 2012 onwards
From Nov: 6th , 13th and 20th
Full Length Mock GATE
Total : 4 tests
Commences from December 2012 onwards
Dec: 02nd (Mock - 1)
Dec: 30th (Mock - 2)
Jan: 27th 2013 (Mock - 3)
Feb: 03rd 2013 (Mock - 4)






Chapter-wise Tests

(Each test carries 25 marks and 45 minutes duration.

Test consists of 5 one mark questions and 10 two mark questions)




TEST Code Topic/Chapter Subject Date (Available from)
EEEC-Test1
DC Analysis
Voltage Division, Current Division, K-Laws, Nodal, Mesh Analysis, Source Transformation, Power Dissipation, Y-Δ Transformation, Quality, Graph Theory.
Electrical Circuits & Fields
Test code: EEEC
No. of test: 3
Available from
July 15th 2012
EEEC-Test2
AC Analysis
AC fundamentals, RMS, Avg. Values, Steady State Analysis,Two port N/W & Theorems
Available from
Aug 12th 2012
EEEC-Test3
Transient Analysis
Resonance, Mag. Coupling CKTs, 3Ø Circuits
Available from
15th Sept 2012





TEST Code Topic/Chapter Subject Date (Available from)
EECS-Test1 Introduction, Signal Flow Graph and Block Diagram, Time Response Analysis
Control systems
Test code: ECCS
No. of test: 3
Available from
July 18th 2012
EECS-Test2 Routh Hurwitz Stability criteria and Root Locus Diagram
Available from
Aug 15th 2012
EECS-Test3 Frequency Response Analysis,State Space Analysis & Controller
Available from
18th Sept 2012












TEST Code Topic/Chapter Subject Date (Available from)
EEMA-Test1 Single Phase Transformers, Three Phase Transformers
Machines
Test code: EEMA
No. of test: 3
Available from
July 21st 2012
EEMA-Test2 Working Principle & Performance of Induction Machines, Speed Control & Starting Methods
Available from
Aug 18th 2012
EEMA-Test3 Synchronous Machines & Misc. Machine DC Machines
Available from
10th Sept 2012



TEST Code Topic/Chapter Subject Date (Available from)
EEAC-Test1 Diodes, BJT & Biasing , BJT A/C Analysis
Analog Circuits
Test code: ECAC
No. of test: 3
Available from
July 24th 2012
EEAC-Test2 FET biasing, Amplifiers, Negative feedback, amplifier oscillators
Available from
Aug 21st 2012
EEAC-Test3 OP-amps & its applications
Available from
21st Sept 2012



TEST Code Topic/Chapter Subject Date (Available from)
EEDC-Test1 Boolean Algebra & K-Maps
Digital Circuits & Microprocessor
Test code: ECDC
No. of test: 3
Available from
July 27th 2012
EEDC-Test2 Combinational Circuits Sequential Circuits
Available from
Aug 24th 2012
EEDC-Test3 Semi conductor memories, A/D & D/A converters Microprocessors
Available from
24th Sept 2012



TEST Code Topic/Chapter Subject Date (Available from)
EESS-Test1 Introduction & LTI (LSI) System
Signals & Systems
Test code: ECSS
Available from
July 30th 2012
EESS-Test2 Fourier Series & Transform,Laplace Transform
Available from
Aug 27th 2012
EESS-Test3 DTFT & Z-Transform, DFT & FFT
Available from
27th Sept 2012



TEST Code Topic/Chapter Subject Date (Available from)
EEME-Test1 Fundamentals, Error Analysis & Basic Instruments, Measurement of Power, Energy & bridges
Measurements
Test code: EEME
No. of test: 2
Available from
Aug 12th 2012
EEME-Test2 Q – Meter, Oscilloscope, Potentiometric Recorders, Digital, Voltmeters, Multimeters, Rectifier Intruments
Available from
Sept 02nd 2012



TEST Code Topic/Chapter Subject Date (Available from)
EEEF-Test1 EMF
Electromagnetic Field
Test code: ECEF
No. of test: 1
Available from
04th Sept


TEST Code Topic/Chapter Subject Date (Available from)
EEPE-Test1 Semiconductor Power Devices – Diodes, Transistors, Thyristors, triacs, GTOs, Static Characteristics & Principles of Operations Triggering Circuits
Power Electronics
Test code: EEPE
No. of test: 3
Available from
July 17th
EEPE-Test2 Phase Controlled Rectifiers & Choppers
Available from
Aug 16th
EEPE-Test3 Inverters ,Drives (A.C. & D.C.), Power BJT. MOSFET & Commutation Techniques
Available from
10th Sept






TEST Code Topic/Chapter Subject Date (Available from)
EEPS-Test1 Line Constants, Performance of Lines, Insulators, Cables, Distribution & Voltage Control
Power Systems
Test code: EEPS
No. of test: 3
Available from
July 21st
EEPS-Test2 Symmetrical Components, Fault Calculations & Per Unit Analysis & Stability
Available from
Aug 26th
EEPS-Test3 Economic Load Dispatch & Load Flow Studies, Protection, Circuit Breaker & Generation
Available from
04th Sept



TEST Code Topic/Chapter Subject Date (Available from)
EEEM-Test1 Probability & Statistics, Numerical Methods
ENGG. Mathematics
Test code: ECEM
No. of test: 3
Available from
July 19th
EEEM-Test2 Linear Algebra & Differential Equations
Available from
Aug 10th
EEEM-Test3 Calculus- Vector Calculus, Fourier Series, Transform Theory, Complex Variables
Available from
Sept 20th



TEST Code Topic/Chapter Subject Date (Available from)
EEVA-Test1 Verbal Analogies, Word Groups & Instructions, Critical Reasoning and Verbal Deduction.
Verbal Ability {English}GA
Test code: EEVA
No. of test: 2
Available from
July 17th
EEVA-Test2 English grammar & Sentence Completion, Critical Reasoning and Verbal Deduction.
Available from
Aug 10th



TEST Code Topic/Chapter Subject Date (Available from)
EENA-Test1 Numerical Estimation, Numerical Reasoning.
Numerical Ability{Aptitude}GA
Test code: EENA
No. of test: 3
Available from
July 19th
EENA-Test2 Numerical Computation & Logical Puzzles
Available from
Aug 22nd
EENA-Test3 Data Interpretation.
Available from
06th Sept





Subject-wise Grand Tests – 1st Series

(Each test carries 50 marks and 90 minutes duration.

Test consists of 10 one mark questions and 20 two mark questions)


1st Series: Commence from 03rd October  2012 onwards, the detailed test schedule is as follows:

Test Code Subject Grand Test Date(Available from)
GT-EEGA1 General Aptitude + General English 2012 Oct 03rd Wednesday
GT-EEEM1 Engineering Mathematics 2012 Oct 06th Saturday
GT-EEEC1 Electrical Circuits & Fields 2012 Oct 09th Tue
GT-EEEM1 Electrical Machines 2012 Oct 12th Fri
GT-EEAC1 Analog Circuits 2012 Oct 15th Monday
GT-EEDC1 Digital Circuits 2012 Oct 18th Thursday
GT-EES1 Signals & Systems 2012 Oct 21st Sunday
GT-EECS1 Control Systems 2012 Oct 24th Wednesday
GT-EEPS1 Power systems 2012 Oct 27th Sat.
GT-EEEF1 Electromagnetic Fields 2012 Oct 30th Tuesday
GT-EEME1 Measurements 2012 NOV 01st Tuesday
GT-EEPE1 Power electronics and Drives 2012 NOV 04th Tuesday



Subject-wise Grand Tests - 2nd Serier

(Each test carries 50 marks and 90 minutes duration.

Test consists of 10 one mark questions and 20 two mark questions)


2nd Series: Commence from 05th January  2013 onwards, the detailed test schedule is as follows:

Test Code Subject Grand Test Date(Available from)
GT-GAGE2 General Aptitude + General English 2013 Jan 05th
GT-EEEM2 Engineering Mathematics 2013 Jan 07th
GT-EEEC2 Electrical Circuits & Fields 2013 Jan 08th
GT-EEEM2 Electrical Machines 2013 Jan 09th
GT-EEAC2 Analog Circuits 2013 Jan 10th
GT-EEDC2 Digital Circuits 2013 Jan 11th
GT-EES2 Signals & Systems 2013 Jan 12th
GT-EECS2 Control Systems 2013 Jan 14th
GT-EEPS2 Power systems 2013 Jan 15th
GT-EEEF2 Electromagnetic Fields 2013 Jan 16th
GT-EEME2 Measurements 2013 Jan 17th
GT-EEPE2 Power electronics and Drives 2013 Jan 18th



Multiple Subject Grand Tests(MSGT)

(Each test carries 75 marks and 2Hr and 15 min duration.

Test consists of 15 one mark questions and 30 two mark questions)



TEST Code Description Date (Available from)
NOV-EEMSGT-1
Aptitude + Maths + General English
2012 Nov 6th
NOV-EEMSGT-2
Electrical Circuits & Fields + Controls + Analog + Digital and microprocessor
2012 Nov 13th
NOV-EEMSGT-3
Power systems + machines + Power Electronics + measurements + Electromagnetic Field
2012 Nov 20th


Full Length Mock GATE


(Each test carries 100 marks and 3 hours duration.

As per GATE Pattern)

TEST CODE Full Length Mock GATE Date (Available from) Syllabus
EEMOCK1
Mock – 1
02nd Dec 2012 (Sunday) Total syllabus
EEMOCK2
Mock – 2
30th Dec 2012 (Sunday) Total syllabus
EEMOCK3
Mock – 3
27th Jan 2013 (Sunday) Total syllabus
EEMOCK4
Mock – 4
03rd Feb 2013 (Sunday) Total syllabus


Click Here To BUY This Test Series

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